Мақаланы E-mail арқылы жіберу Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO2/Si(001)
- Авторлар: Balashev V.V.1,2, Ermakov K.S.2, Chebotkevich L.A.2, Korobtsov V.V.1,2
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Мекемелер:
- Institute of Automation and Control Processes, Far Eastern Branch
- School of Natural Sciences
- Шығарылым: Том 44, № 7 (2018)
- Беттер: 595-598
- Бөлім: Article
- URL: https://medbiosci.ru/1063-7850/article/view/207783
- DOI: https://doi.org/10.1134/S1063785018070040
- ID: 207783
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Аннотация
Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.
Авторлар туралы
V. Balashev
Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences
Хат алмасуға жауапты Автор.
Email: balashev@mail.dvo.ru
Ресей, Vladivostok, 690041; Vladivostok, 690090
K. Ermakov
School of Natural Sciences
Email: balashev@mail.dvo.ru
Ресей, Vladivostok, 690090
L. Chebotkevich
School of Natural Sciences
Email: balashev@mail.dvo.ru
Ресей, Vladivostok, 690090
V. Korobtsov
Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences
Email: balashev@mail.dvo.ru
Ресей, Vladivostok, 690041; Vladivostok, 690090
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